Visible to the public Error value driven fault analysis attack

TitleError value driven fault analysis attack
Publication TypeConference Paper
Year of Publication2014
AuthorsYoshikawa, M., Goto, H., Asahi, K.
Conference NameSoftware Engineering, Artificial Intelligence, Networking and Parallel/Distributed Computing (SNPD), 2014 15th IEEE/ACIS International Conference on
Date PublishedJune
Keywordsadvanced encryption standard, AES, Ciphers, Circuit faults, cryptographic circuits, cryptography, Encryption, Equations, Error value, error value driven fault analysis attack method, Fault analysis attacks, field programmable gate arrays, Side-channel attack, Standards, Tamper resistance

The advanced encryption standard (AES) has been sufficiently studied to confirm that its decryption is computationally impossible. However, its vulnerability against fault analysis attacks has been pointed out in recent years. To verify the vulnerability of electronic devices in the future, into which cryptographic circuits have been incorporated, fault Analysis attacks must be thoroughly studied. The present study proposes a new fault analysis attack method which utilizes the tendency of an operation error due to a glitch. The present study also verifies the validity of the proposed method by performing evaluation experiments using FPGA.

Citation Key6888689