Visible to the public Multiple-fault diagnosis of analog circuit with fault tolerance

TitleMultiple-fault diagnosis of analog circuit with fault tolerance
Publication TypeConference Paper
Year of Publication2017
AuthorsDong, H., Ma, T., He, B., Zheng, J., Liu, G.
Conference Name2017 6th Data Driven Control and Learning Systems (DDCLS)
Date Publishedmay
ISBN Number978-1-5090-5461-9
Keywordsanalog circuit, Analog circuits, analogue circuits, Circuit faults, element isolation, fault characteristic equation, fault detection, fault diagnosis, fault rough set generation, Fault tolerance, Human Behavior, human factor, human factors, Linear programming, Mathematical model, Metrics, multiple fault diagnosis, Multiple-fault, multiple-fault diagnosis, nominal circuit node voltages, parameter estimation, pubcrawl, resilience, Resiliency, rough set theory, Rough sets, Tolerance

A novel method, consisting of fault detection, rough set generation, element isolation and parameter estimation is presented for multiple-fault diagnosis on analog circuit with tolerance. Firstly, a linear-programming concept is developed to transform fault detection of circuit with limited accessible terminals into measurement to check existence of a feasible solution under tolerance constraints. Secondly, fault characteristic equation is deduced to generate a fault rough set. It is proved that the node voltages of nominal circuit can be used in fault characteristic equation with fault tolerance. Lastly, fault detection of circuit with revised deviation restriction for suspected fault elements is proceeded to locate faulty elements and estimate their parameters. The diagnosis accuracy and parameter identification precision of the method are verified by simulation results.

Citation Keydong_multiple-fault_2017