Visible to the public Biblio

Filters: Author is Shintani, M.  [Clear All Filters]
2019-03-15
Hossain, F. S., Shintani, M., Inoue, M., Orailoglu, A..  2018.  Variation-Aware Hardware Trojan Detection through Power Side-Channel. 2018 IEEE International Test Conference (ITC). :1-10.
A hardware Trojan (HT) denotes the malicious addition or modification of circuit elements. The purpose of this work is to improve the HT detection sensitivity in ICs using power side-channel analysis. This paper presents three detection techniques in power based side-channel analysis by increasing Trojan-to-circuit power consumption and reducing the variation effect in the detection threshold. Incorporating the three proposed methods has demonstrated that a realistic fine-grain circuit partitioning and an improved pattern set to increase HT activation chances can magnify Trojan detectability.
2018-04-11
Hossain, F. S., Yoneda, T., Shintani, M., Inoue, M., Orailoglo, A..  2017.  Intra-Die-Variation-Aware Side Channel Analysis for Hardware Trojan Detection. 2017 IEEE 26th Asian Test Symposium (ATS). :52–57.

High detection sensitivity in the presence of process variation is a key challenge for hardware Trojan detection through side channel analysis. In this work, we present an efficient Trojan detection approach in the presence of elevated process variations. The detection sensitivity is sharpened by 1) comparing power levels from neighboring regions within the same chip so that the two measured values exhibit a common trend in terms of process variation, and 2) generating test patterns that toggle each cell multiple times to increase Trojan activation probability. Detection sensitivity is analyzed and its effectiveness demonstrated by means of RPD (relative power difference). We evaluate our approach on ISCAS'89 and ITC'99 benchmarks and the AES-128 circuit for both combinational and sequential type Trojans. High detection sensitivity is demonstrated by analysis on RPD under a variety of process variation levels and experiments for Trojan inserted circuits.