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Cui, H., Liu, C., Hong, X., Wu, J., Sun, D..  2020.  An Improved BICM-ID Receiver for the Time-Varying Underwater Acoustic Communications with DDPSK Modulation. 2020 IEEE International Conference on Signal Processing, Communications and Computing (ICSPCC). :1—4.
Double differential phase shift keying(DDPSK) modulation is an efficient method to compensate the Doppler shifts, whereas the phase noise will be amplified which results in the signal-to-noise ratio (SNR) loss. In this paper, we propose a novel receiver architecture for underwater acoustic DSSS communications with Doppler shifts. The proposed method adopts not only the DDPSK modulation to compensate the Doppler shifts, but also the improved bit-interleaved coded modulation with iterative decoding (BICM-ID) algorithm for DDPSK to recover the SNR loss. The improved DDPSK demodulator adopts the multi-symbol estimation to track the channel variation, and an extended trellis diagram is constructed for DDPSK demodulator. Theoretical simulation shows that our system can obtain around 10.2 dB gain over the uncoded performance, and 7.4 dB gain over the hard-decision decoding performance. Besides, the experiment conducted in the Songhua Lake also shows that the proposed receiver can achieve lower BER performance when Doppler shifts exists.
L
Lin, T., Shi, Y., Shu, N., Cheng, D., Hong, X., Song, J., Gwee, B. H..  2020.  Deep Learning-Based Image Analysis Framework for Hardware Assurance of Digital Integrated Circuits. 2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA). :1—6.
We propose an Artificial Intelligence (AI)/Deep Learning (DL)-based image analysis framework for hardware assurance of digital integrated circuits (ICs). Our aim is to examine and verify various hardware information from analyzing the Scanning Electron Microscope (SEM) images of an IC. In our proposed framework, we apply DL-based methods at all essential steps of the analysis. To the best of our knowledge, this is the first such framework that makes heavy use of DL-based methods at all essential analysis steps. Further, to reduce time and effort required in model re-training, we propose and demonstrate various automated or semi-automated training data preparation methods and demonstrate the effectiveness of using synthetic data to train a model. By applying our proposed framework to analyzing a set of SEM images of a large digital IC, we prove its efficacy. Our DL-based methods are fast, accurate, robust against noise, and can automate tasks that were previously performed mainly manually. Overall, we show that DL-based methods can largely increase the level of automation in hardware assurance of digital ICs and improve its accuracy.