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Kızmaz, Muhammed Mustafa, Ergün, Salih.  2021.  Skew-Tent Map Based CMOS Random Number Generator with Chaotic Sampling. 2021 19th IEEE International New Circuits and Systems Conference (NEWCAS). :1—4.
Random number generators (RNGs) has an extensive application area from cryptography to simulation software. Piecewise linear one-dimensional (PL1D) maps are commonly preferred structures used as the basis of RNGs due to their theoretically proven chaotic behavior and ease of implementation. In this work, a skew-tent map based RNG is designed by using the chaotic sampling method in TSMC 180 nm CMOS process. Simulation data of the designed RNG is validated by the statistical randomness tests of the FIPS-140-2 and NIST 800-22 suites. The proposed RNG has three key features: the generated bitstreams can fulfill the randomness tests without using any post processing methods; the proposed RNG has immunity against external interference thanks to the chaotic sampling method; and higher bitrates (4.8 Mbit/s) can be achieved with relatively low power consumption (9.8 mW). Thus, robust RNG systems can be built for high-speed security applications with low power by using the proposed architecture.
Ergün, Salih, Maden, Fatih.  2021.  An ADC Based Random Number Generator from a Discrete Time Chaotic Map. 2021 26th IEEE Asia-Pacific Conference on Communications (APCC). :79—82.
This paper introduces a robust random number generator that based on Bernoulli discrete chaotic map. An eight bit SAR ADC is used with discrete time chaotic map to generate random bit sequences. Compared to RNGs that use the continuous time chaotic map, sensitivity to process, voltage and temperature (PVT) variations are reduced. Thanks to utilizing switch capacitor circuits to implement Bernoulli chaotic map equations, power consumption decreased significantly. Proposed design that has a throughput of 500 Kbit/second is implemented in TSMC 180 nm process technology. Generated bit sequences has successfully passed all four primary tests of FIPS-140-2 test suite and all tests of NIST 820–22 test suite without post processing. Furthermore, data rate can be increased by sacrificing power consumption. Hence, proposed architecture could be utilized in high speed cryptography applications.