DATE 2025
Date: Mar 31, 2025 6:00 am – Apr 02, 2025 4:00 pm
Location: Palais des congrès de Lyon, Lyon, France
Design, Automation and Test in Europe Conference The European Event for Electronic System Design & Test
The 28th DATE conference is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emphasis on both technology and systems, covering ICs/SoCs, emerging technologies, embedded systems and embedded software.
The multi-day event consists of a conference with keynote talks, regular papers, panels, hot-topic sessions, tutorials, workshops, special focus days and a track for executives. The organisation of user group meetings, fringe meetings, a Young People Programme, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design automation, design and test communities. Special space will also be allocated for multi-partner innovative research projects to show their results. More details will be available on the DATE website: https://www.date-conference.com.
Areas of Interest
Within the scope of the conference, the main areas of interest are: design automation, design tools and hardware architectures for electronic and embedded systems; test and dependability at system, chip, circuit and device level for analogue and digital electronics; modelling, analysis, design and deployment of embedded software and cyber-physical systems; application design and industrial design experiences. Topics of interest include, but are not restricted to:
- Quantum Computing Solutions
- System-level design methodologies and high-level synthesis
- System simulation and validation
- Design and test for analogue and mixed-signal circuits and systems, and MEMS
- Design and test of hardware security primitives
- Design and test of secure systems
- Formal methods and verification
- Network on chip and on-chip communication
- Architectural and microarchitectural design
- Low-power, energy-efficient and thermal-aware design
- Approximate computing
- Reconfigurable systems
- Logical analysis and design
- Physical analysis and design
- Emerging design technologies for future computing
- Emerging design technologies for future memories
- Power-efficiency and Smart Energy Systems for Sustainable Computing
- Smart Society and Digital Wellness
- Secure Systems, Circuits and Architectures
- Autonomous Systems and Smart Industry
- Applications of Emerging Technologies
- Applications of Artificial Intelligence Systems
- Applications of Emerging Technologies
- Modelling and mitigation of defects, faults, variability, and reliability
- Test generation, test architectures, design for test, and diagnosis
- Dependability and system-level test
- Embedded software architecture, compilers and tool chains
- Real-time, dependable and privacy-enhanced systems
- Machine learning solutions for embedded and cyber-physical systems
- Design methodologies for machine learning architectures
- Design modelling and verification for embedded and cyber-physical systems
Chairs
General Chair:
Aida Todri-Sanial, Eindhoven University of Technology, NL
Email: a.todri.sanial@tue.nl
Programme Chair:
Theocharis Theocharides, University of Cyprus, CY
Email: theocharides.theocharis@ucy.ac.cy
Conference Organisation
c/o K.I.T. Group GmbH Dresden
Bautzner Str. 117–119, 01099 Dresden, DE
Phone: +49 351 65573-137
E-mail: date@kitdresden.de
Submitted by Amy Karns
on
Design, Automation and Test in Europe Conference The European Event for Electronic System Design & Test
The 28th DATE conference is the main European event bringing together designers and design automation users, researchers and vendors as well as specialists in hardware and software design, test and manufacturing of electronic circuits and systems. DATE puts strong emphasis on both technology and systems, covering ICs/SoCs, emerging technologies, embedded systems and embedded software.
The multi-day event consists of a conference with keynote talks, regular papers, panels, hot-topic sessions, tutorials, workshops, special focus days and a track for executives. The organisation of user group meetings, fringe meetings, a Young People Programme, vendor presentations and social events offers a wide variety of extra opportunities to meet and exchange information on relevant issues for the design automation, design and test communities. Special space will also be allocated for multi-partner innovative research projects to show their results. More details will be available on the DATE website: https://www.date-conference.com.
Areas of Interest
Within the scope of the conference, the main areas of interest are: design automation, design tools and hardware architectures for electronic and embedded systems; test and dependability at system, chip, circuit and device level for analogue and digital electronics; modelling, analysis, design and deployment of embedded software and cyber-physical systems; application design and industrial design experiences. Topics of interest include, but are not restricted to:
- Quantum Computing Solutions
- System-level design methodologies and high-level synthesis
- System simulation and validation
- Design and test for analogue and mixed-signal circuits and systems, and MEMS
- Design and test of hardware security primitives
- Design and test of secure systems
- Formal methods and verification
- Network on chip and on-chip communication
- Architectural and microarchitectural design
- Low-power, energy-efficient and thermal-aware design
- Approximate computing
- Reconfigurable systems
- Logical analysis and design
- Physical analysis and design
- Emerging design technologies for future computing
- Emerging design technologies for future memories
- Power-efficiency and Smart Energy Systems for Sustainable Computing
- Smart Society and Digital Wellness
- Secure Systems, Circuits and Architectures
- Autonomous Systems and Smart Industry
- Applications of Emerging Technologies
- Applications of Artificial Intelligence Systems
- Applications of Emerging Technologies
- Modelling and mitigation of defects, faults, variability, and reliability
- Test generation, test architectures, design for test, and diagnosis
- Dependability and system-level test
- Embedded software architecture, compilers and tool chains
- Real-time, dependable and privacy-enhanced systems
- Machine learning solutions for embedded and cyber-physical systems
- Design methodologies for machine learning architectures
- Design modelling and verification for embedded and cyber-physical systems
Chairs
General Chair:
Aida Todri-Sanial, Eindhoven University of Technology, NL
Email: a.todri.sanial@tue.nl
Programme Chair:
Theocharis Theocharides, University of Cyprus, CY
Email: theocharides.theocharis@ucy.ac.cy
Conference Organisation
c/o K.I.T. Group GmbH Dresden
Bautzner Str. 117–119, 01099 Dresden, DE
Phone: +49 351 65573-137
E-mail: date@kitdresden.de