ERMAVSS 2016
Date: Mar 18, 2016 1:00 am – Mar 18, 2016 12:00 pm
Location: Dresden, Germany
International Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems (ERMAVSS)
Dresden, Germany (co-located with DATE) | Friday March 18th, 2016 | http://ermavss.iroctech.com/
About the Workshop
With the proliferation of integrated circuits implemented in the most advanced process technologies, there is a growing need to jointly analyze the effect of multiple sources of failures including variability and aging and to understand, early in the design cycle, their impact on system reliability. Today, conservative margins are required to ensure devices operate correctly over their full lifetime, despite the impact of aging effects (BTI, HCI) and failure mechanisms such as EM. New methodologies for improved cross-layer modeling and mitigation, if planned early in the design of a product, have the potential to remove unnecessary conservatism, reduce power and cost and improve yield. This workshop is focused on sharing new research on techniques and methodologies for modeling the effects of failures due to transistor aging, variability and other mechanisms all the way from the cell level to system level. New approaches to perform early estimations of system reliability are much needed to enable cost-effective designs jointly optimized with respect to reliability, power consumption as well as costs. The workshop is co-located with the ACM/IEEE DATE 2016 conference (http://www.date-conference.com/) in Dresden, Germany and will include talks from industry experts.
One session of the workshop will be dedicated to Tool Demos. The focus is on tools which provide features around:
- Early reliability modeling for complex silicon devices
- Advanced Modeling of degradation effects (HCI, xBTI, EM) and variability
- New EDA flows for analyzing the effects of variability and aging
- Assessment of semiconductor degradation and failure effects on embedded and safety critical systems
- Modeling of the effects of environment, mission profile and workload on reliability
Tool presenters will be given the opportunity to give a 1-2 minute short pitch for their tool at the podium. They will then be provided with a small table suitable for a laptop. The workshop participants will go around to see the tools in action and to discuss with the developers. This session is open for tools developed by universities or SMEs. Tool presenters will also be able to submit a two-page short paper which will be included with the workshop proceedings. All presenters must register for the workshop. To submit a request for a tool demo, please go to : http://ermavss.iroctech.com/index.php/tools-demo/.
Registration: https://react-profile.org/DATE2016/Registration/
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International Workshop on Early Reliability Modeling for Aging and Variability in Silicon Systems (ERMAVSS)
Dresden, Germany (co-located with DATE) | Friday March 18th, 2016 | http://ermavss.iroctech.com/
About the Workshop
With the proliferation of integrated circuits implemented in the most advanced process technologies, there is a growing need to jointly analyze the effect of multiple sources of failures including variability and aging and to understand, early in the design cycle, their impact on system reliability. Today, conservative margins are required to ensure devices operate correctly over their full lifetime, despite the impact of aging effects (BTI, HCI) and failure mechanisms such as EM. New methodologies for improved cross-layer modeling and mitigation, if planned early in the design of a product, have the potential to remove unnecessary conservatism, reduce power and cost and improve yield. This workshop is focused on sharing new research on techniques and methodologies for modeling the effects of failures due to transistor aging, variability and other mechanisms all the way from the cell level to system level. New approaches to perform early estimations of system reliability are much needed to enable cost-effective designs jointly optimized with respect to reliability, power consumption as well as costs. The workshop is co-located with the ACM/IEEE DATE 2016 conference (http://www.date-conference.com/) in Dresden, Germany and will include talks from industry experts.
One session of the workshop will be dedicated to Tool Demos. The focus is on tools which provide features around:
- Early reliability modeling for complex silicon devices
- Advanced Modeling of degradation effects (HCI, xBTI, EM) and variability
- New EDA flows for analyzing the effects of variability and aging
- Assessment of semiconductor degradation and failure effects on embedded and safety critical systems
- Modeling of the effects of environment, mission profile and workload on reliability
Tool presenters will be given the opportunity to give a 1-2 minute short pitch for their tool at the podium. They will then be provided with a small table suitable for a laptop. The workshop participants will go around to see the tools in action and to discuss with the developers. This session is open for tools developed by universities or SMEs. Tool presenters will also be able to submit a two-page short paper which will be included with the workshop proceedings. All presenters must register for the workshop. To submit a request for a tool demo, please go to : http://ermavss.iroctech.com/index.php/tools-demo/.
Registration: https://react-profile.org/DATE2016/Registration/