The terms denote engineering domains that have high CPS content.
Event
SEUS 2014
10th Workshop on Software Technologies for Future Embedded and
Ubiquitous Systems (SEUS 2014) June 08--09, 2014 -- Reno, Nevada, USA
Event
IEEE INDIN2014
12th IEEE INTERNATIONAL CONFERENCE ON INDUSTRIAL INFORMATICS - INDIN 2014
&nb
Event
ES Week 2014
Embedded Systems Week (ESWEEK) is the premier event covering all aspects of embedded systems and software. By bringing together three leading conferences (CASES, CODES+ISSS, and EMSOFT), two symposia (ESTIMedia and RSP) and several workshops and tutorials, ESWeek allows attendees to benefit from a wide range of topics covering the state of the art in embedded systems research and development.
Event
DCOSS 2014
Distributed sensor systems have become a highly active research area due
to their potential for providing diverse new capabilities applications.
Event
EUC 2014
Welcome to EUC 2014!
Embedded and ubiquitous computing is an exciting paradigm that promises to provide computing and communication services to the end users all the time and everywhere. Its systems are now invading in every aspect of our daily life and promise to revolutionize our life much more profoundly than elevators, electric motors or even personal computer evolution ever did.
Event
SORT 2014
SORT 2014
5th IEEE Workshop on Self-Organizing Real-Time Systems
Reno, Nevada, USA, June 9th, 2014
(http://www.es.cs.uni-frankfurt.de/?id=sort2014)
Event
RePP 2014
Reconciling Performance with Predictability
Event
Robotic Sensor Networks
The 1st Workshop on Robotic Sensor Networks
- part of CPSWEEK -
Event
ICECCS 2014
The 19th IEEE International Conference on Engineering of Complex Computer Systems
Event
MCS 2014
2nd International workshop on the Integration of mixed-criticality subsystems on multi-core and manycore processors
21-22 January 2014
Background
Modern embedded applications typically integrate a multitude of functionalities with potentially different criticality levels into a single system. Without appropriate preconditions, the integration of mixed-criticality subsystems can lead to a significant and potentially unacceptable increase of engineering and certification costs.