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Cyber-Physical Systems Virtual Organization
Fostering collaboration among CPS professionals in academia, government, and industry
CPS-VO
box plot visual inspection
biblio
Process Metrics Are Not Bad Predictors of Fault Proneness
Submitted by
grigby1
on Thu, 12/28/2017 - 1:30pm
Bayes methods
box plot visual inspection
classifier
Couplings
fault prediction performance evaluation
fault proneness
fault/defect prediction models
faults
faulty classes
faulty modules
Inspection
Metrics
Naive Bayes
Niobium
pattern classification
prediction
Predictive Metrics
Predictive models
predictive security metrics
process metrics
pubcrawl
software metrics
software quality
static code metrics
statistical analysis
trust-worthy predictions
Trusted Computing
