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initially amorphous nickel oxide layers

biblio

Visible to the public Unexpected Development of Perpendicular Magnetic Anisotropy in Ni/NiO Multilayers After Mild Thermal Annealing

Submitted by aekwall on Mon, 11/30/2020 - 11:14am
  • Internet of Things
  • Resiliency
  • pubcrawl
  • cyber physical systems
  • Compositionality
  • Magnetic domains
  • remanence
  • hysteresis loops
  • magnetic hysteresis
  • nanomagnetics
  • nanostructured materials
  • Anisotropic magnetoresistance
  • Magnetometers
  • Nonhomogeneous media
  • Nickel
  • perpendicular magnetic recording
  • Magnetic Remanence
  • anisotropy enhancement
  • annealing
  • in-plane remanence
  • initially amorphous nickel oxide layers
  • inplane anisotropy
  • layer roughening
  • Magnetic films
  • magnetic measurements
  • Magnetic multilayers
  • magnetic thin films
  • mild thermal annealing
  • Ni-NiO
  • nickel compounds
  • nickel layer thickness
  • nickel-nickel oxide multilayers
  • normal-to-film-plane direction
  • partial crystallization
  • Perpendicular magnetic anisotropy
  • size 7.0 nm
  • spin electronics
  • surface anisotropy
  • temperature 250.0 degC
  • transmission electron microscopy
  • volume anisotropy

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