Automated and Robust Nano-Assembly with Atomic Force Microscopes
Abstract:
Atomic force microscopes (AFM) can be used to both image and modify samples at molecular or even atomic resolution, in an ambient environment with little to no sample preparation. AFM based nanomanipulation and nanoassembly compares favorably with other techniques such as electron- beam lithography in cost, repeatability, accuracy, and resolution.
Submitted by Xiaoping Qian
on
Abstract:
Atomic force microscopes (AFM) can be used to both image and modify samples at molecular or even atomic resolution, in an ambient environment with little to no sample preparation. AFM based nanomanipulation and nanoassembly compares favorably with other techniques such as electron- beam lithography in cost, repeatability, accuracy, and resolution.
Submitted by Xiaoping Qian
on